Centalic Technology Development Ltd

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共5 筆產品

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1. ICT probe PE50-H-5G

ICT probe PE50-H-5G
Test Centers-50mil(1.27mm)

Technical Specifications
Recommended Minimum Center: 1.27mm (50 mil)
Current Raring: 3amps, continuous
Contact Resistance: 50milliohms
Mounting Holes Size:diameter 1.0
Full Stroke: ...

2. Rigid Contact Probes PUMS/PUMSC Series

Characteristics:
1. The rigid test pins of the type PUM are compatible used in the adapter 87. They are flexible and can be deflected through several mm depending upon the diameter.
2. Suitable for the electrical testing of unfitted printed ...

3. ICT probe PE50-H-5G

4. Spring contact probe Centalic series P14

Spring contact probe Centalic series P14
Test centers-14mils(0.45mm)

Technical specifications (Recommended)
Minimum Center : 0.45mm(14mil)
Current Rating:0.3amps, continuous
Contact Resistance:250milliohms
Mounting Holes size: diameter ...

5. Semiconductor test probes PGD30-UU-0.8G

Semiconductor test probes PGD30-UU-0.8G
Pitch 0.50mm

Mechanical Specification
Full Stroke: 1.10mm
Rated Stroke: 0.80mm
Spring Force: 25gf Load 0.80mm

Electrical Specification
Current Rating: 0.5 A, Continuous
Bandwidth:4.3GHz ...